Volume 2 Number 6 (Nov. 2012)
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IJAPM 2012 Vol.2(6): 439-441
doi: 10.7763/IJAPM.2012.V2.155

Optical Characteristics of TiO<sub>2</sub> Thin Films Sensitized with the Natural Dye of Clitoria Ternatea

Rachel Oommen 1 , P. Usha Rajalakshmi 1 , S. Sudha 2

  • 1 the Department of Physics, Avinashilingam Institute for Home Science and Higer Eductaion for Women, Coimbatore-43, Tamilnadu, India.
  • 2 the Department of Physics, Varuvan Vadivelan Institute of Technology, Krishnagiri, Tamilnadu, India

Abstract

Thin films of TiO<sub>2</sub> are deposited by Successive Ionic Layer Adsorption and Reaction (SILAR) technique. Films are characterized by X-ray diffraction, Scanning Electron Microscopy and UV-Vis. spectrometry. TiO<sub>2</sub> films are sensitized by the natural dye extracted from Clitoris Ternatea. Effect of dye sensitization on the optical properties of TiO<sub>2</sub> thin films is analyzed. A red shift in the optical band gap of the films is observed upon dye sensitization. The direct and indirect band gap of the sensitized films is in the range of 3.2-3.8eV and 2.0-2.9 eV respectively.

Keywords

  • Band gap
  • clitoria ternatea
  • dye sensitization
  • TiO<sub>2</sub>
155-T30007

How to Cite

Copied

Rachel Oommen, P. Usha Rajalakshmi, and S. Sudha, "Optical Characteristics of TiO<sub>2</sub> Thin Films Sensitized with the Natural Dye of Clitoria Ternatea," International Journal of Applied Physics and Mathematics, vol. 2, no. 6, pp. 439-441, 2012. https://doi.org/ 10.7763/IJAPM.2012.V2.155

Copyright & License

Copyright © 2012 by the authors. This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).

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General Information

ISSN: 2010-362X (Online)
Abbreviated Title: Int. J. Appl. Phys. Math.
Frequency: Semi-annual
APC: 500USD
DOI: 10.17706/IJAPM
Editor-in-Chief: Prof. Haydar Akca
Managing Editor: Ms. Phoebe Clifford
Abstracting/ Indexing: INSPEC(IET), CNKI, Google Scholar, EBSCO, Chemical Abstracts Services (CAS), etc.
E-mail: editor@ijapm.org
 

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