DOI: 10.7763/IJAPM.2013.V3.204
A Novel Sample Structure for the Measurement of Indium Segregation Profiles in GaAs/InGaAs/GaAs Heterostructures
Index Terms—In segregation, III-V compound semi-conductors, ToF-SIMS, HRXRD, MBE.
The authors are with La Trobe University, Faculty of Science, Technology and Engineering, School of Engineering and Mathematical Sciences, Department of Electronic Engineering, Bundoora, Victoria 3086, Australia (e-mail: aloykaew@students.latrobe.edu.au, B.Usher@latrobe.edu.au, R.Jones@latrobe.edu.au, P.Pigram@latrobe.edu.au).
Cite:A. Loykaew, B. F. Usher, R. T. Jones, and P. J. Pigram, "A Novel Sample Structure for the Measurement of Indium Segregation Profiles in GaAs/InGaAs/GaAs Heterostructures," International Journal of Applied Physics and Mathematics vol. 3, no. 3, pp. 191-197, 2013.
General Information
-
Jun 23, 2025 News!
IJAPM Vol 15, No 1 has been published online 5 papers are included in this issue [Click]
-
Dec 26, 2024 News!
IJAPM had implemented online submission system:https: ojs ejournal net index php ijapm about submissionsAll the submission will be received via the system
-
Dec 24, 2024 News!
IJAPM Vol 14, No 4 has been published online! [Click]
-
Sep 20, 2024 News!
IJAPM Vol 14, No 3 has been published online! [Click]
-
Jun 26, 2024 News!
IJAPM Vol 14, No 2 has been published online [Click]
- Read more>>